Dislocation dynamics and slip band formation in silicon: In-situ study by X-ray diffraction imaging
| chair: | AN Danilewsky, J Wittge, A Croell, D Allen, P McNally, P Vagovič, T dos Santos Rolo, Z Li, T Baumbach, E Gorostegui-Colinas, J Garagorri, MR Elizalde, MC Fossati, DK Bowen, BK Tanner |
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| place: | Journal of Crystal Growth, Vol.318, Issue 1, 1157-1163 |
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| Date: | 2011 | ||
